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We propose a compact nearfield scheme for fast and broadband dielectric characterization in the microwave region. An open-type circular probe operated in the high-purity TE01 mode was developed, showing a strongly confined fringing field at the open end. This fringing field directly probed the freestanding sheet sample, and the overall reflection was measured. Without sample-loading processes, both of the system assembling time and the risk of sample damage can be significantly reduced. In addition, the nearfield measurement substantia
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