https://www.selleckchem.com/pr....oducts/gsk2334470.ht
The performance of ellipse fitting may significantly degrade in the presence of outliers, which can be caused by occlusion of the object, mirror reflection or other objects in the process of edge detection. In this paper, we propose an ellipse fitting method that is robust against the outliers, and thus maintaining stable performance when outliers can be present. We formulate an optimization problem for ellipse fitting based on the maximum entropy criterion (MCC), having the Laplacian as the kernel function from the well-known fact t
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