https://www.selleckchem.com/pr....oducts/pitstop-2.htm
The correlation between structural order, elasticity, and semiconductivity for butylthio-functionalized polyaniline (PANI-SBu) thin films was investigated using atomic force microscopy (AFM)-based techniques with X-ray diffraction (XRD) and scanning electron microscopy (SEM). After different stirring times, the thin films were cast from the solution of PANI-SBu in N-methyl-2-pyrrolidone that was continuously stirred at a constant rate of 150 rpm in an airtight round-bottom flask. According to the XRD and SEM results, the cross-section
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