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We get that the maximum value of the TEEY of SiO2 is ∼4.2, and the surface charge diffusion distance of SiO2 is ∼1 µm. In this work, the criterion for judging whether the deposited charge is eliminated is obtained, which has not been proposed in traditional measurement methods.We describe an alternating current method to measure the Nernst effect in superconducting thin films at low temperatures. The Nernst effect is an important tool in the understanding of superconducting fluctuations and, in particular, vortex motion near critical p
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