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In shape measurement systems using a grating projection method, the phase analysis of a projected grating provides accurate results. The most popular phase analysis method is the phase shifting method, which requires several images for one shape analysis. Therefore, the object must not move during the measurement. The authors previously proposed a new accurate and high-speed shape measurement method, i.e., the one-pitch phase analysis (OPPA) method, which can determine the phase at every point of a single image of an object with a grati
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